Rigaku 單晶X射線繞射系統 - XtaLAB Synergy-i
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產品說明
用於化學晶體學的現代全尺寸繞射儀
基於最新技術的單晶 X 射線繞射儀，用於小分子樣品的結構分析
Benefits
基於最新技術的單晶 X 射線繞射儀，用於小分子樣品的結構分析
Benefits
- Improve your ability to investigate weakly diffracting samples because the solid-state pixel array technology of the HyPix X-ray detectors means that X-ray photons are counted instantaneously as they arrive at the detector. There is no conversion to visible light by a scintillator so the energy of the photon can be assessed at the moment of detection leading to essentially noise-free images. And noise-free images mean you can count longer for weakly diffracting crystals without a loss in data quality arising from detector noise.
- Automatically solve structures and determine what your sample is in a few seconds before committing to a full dataset by using the “What is this?” feature.
- Minimize your downtime by utilizing built-in online diagnostics and troubleshooting to diagnose and fix almost all problems without a site visit.
- Highest level of user safety with multiply redundant electromechanical safety circuits built into the ergonomically designed radiation enclosure.
- Enhanced experimental versatility when the dual source option is selected.
XtaLAB Synergy-i SPECIFICATIONS
| Product name | XtaLAB Synergy-i |
| Core attributes | Single- or dual-microfocus sealed tube X-ray source diffractometer with hybrid pixel array detector and kappa goniometer |
| Detector | HyPix-Bantam hybrid pixel array detector |
| X-ray Source | PhotonJet-i X-ray source with microfocus sealed tube and graded multi-layer mirror. Two target types are available (Mo or Cu). |
| Goniometer | Kappa-geometry goniometer |
| Accessories | Internal monitor in cabinet, Oxford Cryostream 800, Oxford Cobra, XtalCheck-S, High Pressure Kit |
| Computer | External PC, MS Windows® OS, CrysAlisPro Software |
| Core dimensions | 1300 (W) x 1875 (H) x 850 (D) (mm) |
| Mass | 550 kg (core unit) |
| Power requirements | 1Ø, 90-130 V, 10 A or 180-260 V, 4 A |