HITACHI Scanning Electron Microscopes SU3800/SU3900 1

HITACHI Scanning Electron Microscopes SU3800/SU3900

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Scanning Electron Microscopes SU3800/SU3900
Performance & Power in a Flexible Platform

Hitachi High-Tech's scanning electron microscopes SU3800/SU3900 deliver both operability and expandability. The operator can automate many operations and efficiently utilize their high performance. The SU3900 is equipped with a large multipurpose specimen chamber to accommodate observation of large samples.

 

1.Substantially Larger Specimen Chamber Accommodates Oversized and Heavy Samples
■Robust Stage for Flexibility in Sample Size, Shape, and Weight
  • The specimen exchange sequence prevents potential damage to the system or the sample.
  • Exchange the specimens without venting the specimen chamber, improving throughput.
  • Increase sample manipulation with Stage Free Mode*.
  • The Chamber Scope enhances the safety of stage movements*.
■Increased Viewing Area—SEM MAP Expands the Boundaries of Sample Navigation
  • Integrated in-chamber camera display
  • Easily navigate the entire observable area
  • Detector-oriented rotation
  
 
2.Evolution of the Market—Improved Automatic Functions for Operators of Any Skill Level
■Multiple Modes of Operation
■ Automatic Functions for Operators of Any Skill Level
  • Improved auto algorithms—3X faster (compared with the Hitachi Model S-3700N)
  • Improved auto focus function
  • Features of our proprietary Intelligent Filament Technology (IFT):
■Multi Zigzag enables wide-area observation across multiple areas.
■Report Creator generates reports of acquired data.		  
 
3.Integrated Solutions for Various Applications
■A Variety of Accessories Mountable onto Any of the 20 Ports in the Innovative SU3900 Specimen Chamber.
■SEM/EDS Integration System*
■High Sensitivity Detectors Supporting All Observation Requirements
  • CL observation Using UVD*
  • Segmented BSED allows for visualizing composition and topography.
■STEM Holder
■3D Modeling Software: Hitachi map 3D*
■Image Processing, Measurement, and Analysis Software: Image-Pro for Hitachi

* optional		  
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